Compact USB RF and microwave power sensors and meters introduced by Tektronix for test and measurement

Dec. 15, 2011
BEAVERTON, Ore., 15 Dec. 2011. Tektronix Inc. in Beaverton, Ore., is introducing the PSM3000, PSM4000, and PSM5000 compact USB RF and microwave power sensors and meters for continuous-wave and pulse-modulation test and measurement in applications ranging from installation and maintenance of a wireless base station, production testing, or research and design for wireless devices and radars. The Tektronix PSM RF power meters come calibrated over their operating temperature range. The meters also come Microsoft Windows-based power meter application software for controlling the meter, displaying readings, and recording data.

BEAVERTON, Ore., 15 Dec. 2011. Tektronix Inc. in Beaverton, Ore., is introducing the PSM3000, PSM4000, and PSM5000 compact USB RF and microwave power sensors and meters for continuous-wave and pulse-modulation test and measurement in applications ranging from installation and maintenance of a wireless base station, production testing, or research and design for wireless devices and radar.The Tektronix PSM RF power meters come calibrated over their operating temperature range. The meters also come Microsoft Windows-based power meter application software for controlling the meter, displaying readings, and recording data.The Tektronix PSM series power sensors have measurement speed rated at 2000 readings per second. A high-speed logging application moves this data into a host PC for analysis. The power meters have a dynamic range of -60 dBm to +20 dBm, frequencies ranging from 10 MHz to 26.5 GHz.

The PSM3000 power meter provides average power measurements independent of signal modulation and bandwidth. The PSM4000 delivers average power (CW) measurements, and adds pulse and peak power measurements for gathering basic data on pulsed RF and microwave signals. PSM5000 power sensors and meters provide the same measurements as the PSM4000, and add pulse profiling for signal viewing and characterization in pulsed RF and microwave systems.

For more information contact Tektronix online at www.tektronix.com.

About the Author

John Keller | Editor

John Keller is editor-in-chief of Military & Aerospace Electronics magazine, which provides extensive coverage and analysis of enabling electronic and optoelectronic technologies in military, space, and commercial aviation applications. A member of the Military & Aerospace Electronics staff since the magazine's founding in 1989, Mr. Keller took over as chief editor in 1995.

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