McPherson offers spectral calibration and test for visible, mid-wave and long-wave infrared
Sept. 8, 2007
CHELMSFORD, Mass., 8 Sept. 2007. McPherson Inc. in Chelmsford, Mass., is offering a spectral test station that provides a 100-millimeter diameter collimated and wavelength variable monochromatic light beam to illuminate, spectrally calibrate, and document radiometric sensitivity and response characteristics of spectral and hyper-spectral sensors.
The spectral test station (STS) delivers discrete bands of selected monochromatic light and/or scans selected spectral regions in the 200-nanometer UV to 14-micron LWIR wavelength range. As many as four turret mounted gratings assure efficient coverage of wide spectral ranges.
The gratings snap-in feature permits to replace gratings or add broad or narrow band reflecting mirrors. This provides for testing sensors and detectors with integrated as well as spectrally dispersed light.
The system is especially useful for QC testing of multiple detector chips, CCDs or focal plane arrays in a given wavelength range and for given pixel responsiveness. Chips on substrates in the up to four inch size range can be reliably tested. Output beam collimation is interferometrically tested.
Direct and peripheral sensitivities of sensors with integrated optics or "light gatherers" with limited horizon and trajectory determining "nose cones" can be tested. So can UV, Visible and Infrared seekers and other sensors as well as imaging devices and spectrometers.
For more information contact McPherson online at www.mcphersoninc.com.
