Semiconductor test set for failure analysis and replacing legacy test systems introduced by Marvin
IRVINE, Calif., 8 Dec. 2015. Marvin Test Solutions in Irvine, Calif., is introducing the TS-900 PXI semiconductor test & measurement set for addressing verification, focused production, and failure analysis test needs, or for replacing legacy test systems.
The TS-960 semiconductor test platform features a 20-slot 3U PXI chassis accommodating as many as 512 125-MHz digital I/O channels with PMUs per pin, yet has a small footprint and modular structure, company officials say.
Available as a benchtop, with an integrated cart, or with an integrated manipulator, the TS-960 platform uses the PXI architecture for device, SoC, and SiP test applications.
The GX5296 leverages the features and capabilities of multiple Marvin Test Solutions products, delivering timing, density, memory, and parametric measurement capabilities.
The GX5296 occupies one PXI 3U slot, yet features flexible timing and high-resolution edge placement, providing digital test capabilities and the ability to characterize a device's DC and AC performance.
Key features include 32, 125 MHz digital channels, PMU per pin; timing per pin with 1 ns edge placement; 64 timing set groups; 64 megabits per pin; data formatting (6 formats); -2 to +7 volt drive / sense range; sequencer with 16 loop counters; and compatibility with VCD, eVCD, STIL, and WGL standard digital test file formats.
For more information contact Marvin Test Solutions online at http://marvintest.com.
John Keller | Editor
John Keller is editor-in-chief of Military & Aerospace Electronics magazine, which provides extensive coverage and analysis of enabling electronic and optoelectronic technologies in military, space, and commercial aviation applications. A member of the Military & Aerospace Electronics staff since the magazine's founding in 1989, Mr. Keller took over as chief editor in 1995.
