FREMONT, Calif., 9 July 2010. Elma Electronic Systems in Fremont, Calif., is introducing the E-Frame two-slot VPX/OpenVPX test and development electronic enclosure that connects several backplanes to simulate various fabric topologies.
The embedded computingtest and measurementbackplane chassis, which accommodates 3U VPX and 6U VPX boards via a shelf divider, can help eliminate the need for custom backplanes by enabling systems designers to pass high-speed signals from one slot to the next.
The E-Frame enables developers to power up one or more VPX blades under test and interconnect the J1 fabric connections to emulate the user's application. Signals from an external device can also be introduced through the J1 fabric connector or accessed on the J1 fabric connector using the provided SMA and SATA cable headers.
The use of a standard VPX rear switch module (RTM) plugged into the back provides access to the J0, J2, J3, J4, J5 and J6 connectors, while simultaneously accessing high speed signals in the J1 connector, routed out the side of the backplane. Each slot's J1 "A" channel is broken out into 16 SMA connectors and the "B", "C" and "D" channels into four SATA2 cable headers (12 total per slot).
The test platform has a 1.6-inch card pitch that enables cable access to components on either side of the board under test. A built-in LED voltage monitor provides bus voltage compliance, and VNAs (vector network analyzers) and other probes can be used on the surface of the VPX card under test for enhanced testing capabilities.
