Hitachi FT160 XRF Analyzer

    April 3, 2025
    ​For ultra thin film coating measurements of micro-spot areas
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    Image provided by Eastern Applied Research
    Hitachi FT160 XRF, interior chamber and stage
    Hitachi FT160 XRF, interior chamber and stage

    Built for quality control of micro-electronics and circuits board coating thickness applications, features poly-capillary optics and hi-res silicon drift detector technology. Offers high-throughput through the high precision XY motorized stage.  Learn More

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