High-speed interconnect analyzer oscilloscope for interconnect testing introduced by Teledyne LeCroy

CHESTNUT RIDGE, N.Y. – Teledyne LeCroy in Chestnut Ridge, N.Y., is introducing the WavePulser 40iX high-speed interconnect analyzer oscilloscope for interconnect testing and validation.

The WavePulser 40iX is for high-speed hardware designers and test engineers to characterize and analyze interconnects and cables for high-speed serial protocols such as PCI Express, HDMI, USB, SAS, SATA, Fibre Channel, InfiniBand, Gigabit Ethernet, and Automotive Ethernet.

The WavePulser 40iX simplifies high-speed interconnect testing and validation by unifying time- and frequency-domain characterizations by performing parameter frequency characterization like a vector network analyzer (VNA); impedance profiling like a time-domain reflectometer (TDR); and delivering deep analysis capabilities in one acquisition and in one instrument.

The WavePulser 40iX unravels the complexities in the physical signal path testing testing by characterizing serial data cables, channels, connectors, vias, backplanes, printed circuit boards, chips, and systems on chip (SoC).

The measured S-parameters also may help with additional analyses, including time gating, de-embedding of interconnects, eye diagrams, optimized equalization settings, serial-data pattern simulation, and advanced jitter analysis with breakdown into component elements.

For more information contact Teledyne LeCroy online at http://teledynelecroy.com.