Rugged and flexible VNA test cables for semiconductor probe testing introduced by Fairview Microwave

Oct. 30, 2020
Rugged VNA test cables are for applications like semiconductor probe testing, precise benchtop testing, and production testing.

LEWISVILLE, Texas – Fairview Microwave Inc. in Lewisville, Texas, is introducing vector network analyzer (VNA) test cables for demanding test and laboratory applications like semiconductor probe testing, precise benchtop testing, and production testing that requires a flexible-yet-durable cable solution.

The high-frequency VNA test cables display electrical properties such as phase stability of plus-or-minus 6 degrees at 50 GHz and plus-or-minus 8 degrees at 70 GHz, as well as a voltage standing wave ratio (VSWR) of 1.3:1 at 50 GHz and 1.4:1 at 70 GHz.

The 50 GHz assemblies are terminated with 2.4-millimeter connectors, while the 70 GHz versions use 1.85-millimeter connectors. The braided, stainless steel armoring surrounding the coax provides a rugged-but-flexible cable with a flex life exceeding 100,000 cycles.

Related: 1-millimeter flexible cables for radar, test bench, and microwave radio introduced by Fairview

These VNA test cables are terminated with rugged stainless-steel connectors that provide as many as 5,000 mating cycles when attached with proper care.

The flexibility of these cables makes it safe and easy to use with a device under test (DUT). A swept right-angle 2.4-millimeter and 1.85-millimeter connector option enables these cables to fit into tight spaces and reduce the length of cable in many applications.

For more information contact Fairview Microwave online at www.fairviewmicrowave.com.

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