Millimeter wave semiconductor test and measurement system from Marvin in use by several chip manufacturers
IRVINE, Calif. – Marvin Test Solutions Inc. in Irvine, Calif., is announcing that the company's TS-900e-5G production test system for 5G millimeter wave semiconductor devices is in use by several semiconductor manufacturers.
Rapid industry adoption signals the significance of these test solutions, enabling manufacturers to meet high-throughput production demands for millimeter wave semiconductor devices.
Part of the Marvin Test Solutions GENASYS Semi suite of configurable semiconductor test solutions, the TS-900e-5G is for wafer probing and package test with support for production automation and handling tools.
GENASYS Semi 5G millimeter wave solutions deliver repeatable production VNA / S- parameter measurements, and can support as many as 20 independent VNA ports of 44 GHz signal delivery to the device under test (DUT).
Additionally, the modular architecture of the test system can address the evolving needs of millimeter wave test, with expanded performance to 53 GHz scheduled for this summer.
The TS-900e-5G test and measurement core system includes the Keysight high-throughput VNAs and ATEasy, the MTS suite of software tools that enable users to develop and maintain test applications, as well as ICEasy, which facilitates device test development and characterization.
The TS- 900e-5G core system also includes high-performance dynamic digital I/O with per-pin PMU to support SPI/I2C device communications and DC parametric testing.
For more information contact Marvin Text Solutions online at www.marvintest.com/5G.
